The morphology and structural evolution of nano-SiO2 powers obtained by pressuring samples and sintering in muffle at different temperatures were studied by X-ray diffraction (XRD) and atomic force microscope (AFM). The experimental results show that the particle sizes of nano-SiO2 increase with temperature rising, and it meets the physical mechanism of particle growth
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作者
Jing Zhang,Qi Zhi Cao,Jian Ying Li
期刊
Advanced Materials Research
年份